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Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/2117
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dc.contributor.authorSukit Limpijumnonga-
dc.date.accessioned2008-08-27T06:22:14Z-
dc.date.available2008-08-27T06:22:14Z-
dc.date.issued2006-
dc.identifier.citationApplied physics letters 89, 222113 (2006)en
dc.identifier.urihttp://sutir.sut.ac.th:8080/jspui/handle/123456789/2117-
dc.format.extent274059 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherSchool of Physics, Institute of Science, Suranaree University of Technologyen
dc.subjectAs-dopeden
dc.subjectp-type ZnOen
dc.subjectx-ray absorptionen
dc.subjectnear-edge structure spectroscopyen
dc.titleCharacterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy: Theoryen
dc.typeArticleen
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