Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/3244
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dc.contributor.authorPakpoom Reunchan-
dc.date.accessioned2011-01-04T10:20:01Z-
dc.date.available2011-01-04T10:20:01Z-
dc.date.issued2009-
dc.identifier.urihttp://sutir.sut.ac.th:8080/jspui/handle/123456789/3244-
dc.format.extent4163981 bytes-
dc.format.extent4136776 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherSchool of Physics, Institute of Science Suranaree University of Technologyen
dc.subjectSemiconductorsen
dc.subjectDefectsen
dc.titleFirst principles study of selected defect complexes in semiconductorsen
dc.title.alternativeการศึกษาแบบเฟิสต์พรินซิเพิลของความบกพร้องแบบซับซ้อนที่คัดเลือกในสารกึ่งตัวนำen
dc.typeThesisen
dc.degree.nameDoctor of Philosophy-
dc.degree.levelDoctoral Degree-
Appears in Collections:วิทยานิพนธ์ (Thesis)

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