Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/7482
Full metadata record
DC FieldValueLanguage
dc.contributor.authorNuchalee Schwertfager-
dc.date.accessioned2018-09-10T05:00:41Z-
dc.date.available2018-09-10T05:00:41Z-
dc.date.issued2016-
dc.identifier.urihttp://sutir.sut.ac.th:8080/jspui/handle/123456789/7482-
dc.format.extent4612929 bytes-
dc.format.extent1552360 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherSchool of Physics Institute of Science Suranaree University of Technologyen
dc.subjectSynchrotron lighten
dc.subjectGrapheneen
dc.titleFirst Principles calculations of X-ray measurements on selected materialsen
dc.title.alternativeการคำนวณการวัดด้วยรังสีเอ็กซ์ของสารที่เลือกศึกษาโดยวิธีเฟิสต์พรินซิเพิลen
dc.typeThesisen
dc.degree.nameDoctor of Philosophy-
dc.degree.levelDoctoral Degree-
dc.degree.disciplinePhysics-
dc.degree.grantorSuranaree University of Technology-
Appears in Collections:วิทยานิพนธ์ (Thesis)

Files in This Item:
File Description SizeFormat 
Nuchalee Schwertfager-Abstract.pdfabstract1.52 MBAdobe PDFView/Open
Nuchalee Schwertfager-Fulltext.pdffulltext4.5 MBAdobe PDFView/Open


Items in SUTIR are protected by copyright, with all rights reserved, unless otherwise indicated.