Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/5838
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dc.contributor.authorJaroon Wongjarern-
dc.date.accessioned2016-03-18T08:07:32Z-
dc.date.available2016-03-18T08:07:32Z-
dc.date.issued2015-
dc.identifier.urihttp://sutir.sut.ac.th:8080/jspui/handle/123456789/5838-
dc.format.extent5536662 bytes-
dc.format.extent329354 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherSchool of Laser Technology Institute of Science Suranaree University of Technologyen
dc.subjectFourier transformationsen
dc.subjectFourier analysisen
dc.subject3Den
dc.subjectContrast ratioen
dc.titleStudy of fourier transform profilometry by using background eliminationen
dc.title.alternativeการศึกษาการแปลงฟูริเยร์โพรฟิโลเมทรีโดยใช้การกำจัดพื้นหลังen
dc.typeThesisen
dc.degree.nameMaster of Science-
dc.degree.levelMaster's Degree-
dc.degree.disciplineLaser Technology-
dc.degree.grantorSuranaree University of Technology-
Appears in Collections:วิทยานิพนธ์ (Thesis)

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