Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/2125
Title: Stacking fault band structure in 4H–SiC and its impact on electronic devices
Authors: Miao M.S.
Keywords: electronic devices;Stacking fault band structure;4H–SiC;its impact
Issue Date: 2001
Publisher: School of Physics, Institute of Science, Suranaree University of Technology
Citation: Applied Physics Letters 79(26) p:4360-4362
URI: http://sutir.sut.ac.th:8080/jspui/handle/123456789/2125
Appears in Collections:บทความ (Articles)

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