Please use this identifier to cite or link to this item:
http://sutir.sut.ac.th:8080/jspui/handle/123456789/2125
Title: | Stacking fault band structure in 4H–SiC and its impact on electronic devices |
Authors: | Miao M.S. |
Keywords: | electronic devices;Stacking fault band structure;4H–SiC;its impact |
Issue Date: | 2001 |
Publisher: | School of Physics, Institute of Science, Suranaree University of Technology |
Citation: | Applied Physics Letters 79(26) p:4360-4362 |
URI: | http://sutir.sut.ac.th:8080/jspui/handle/123456789/2125 |
Appears in Collections: | บทความ (Articles) |
Files in This Item:
File | Description | Size | Format | |
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bib1445_f.pdf | Fulltext | 41.56 kB | Adobe PDF | View/Open |
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